发明申请
- 专利标题: Substrate Material for Analyzing Fluids
- 专利标题(中): 用于分析流体的基材
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申请号: US12096920申请日: 2006-11-28
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公开(公告)号: US20080312106A1公开(公告)日: 2008-12-18
- 发明人: Ralph Kurt , Dirk Jan Broer , Roel Penterman , Emiel Peeters
- 申请人: Ralph Kurt , Dirk Jan Broer , Roel Penterman , Emiel Peeters
- 申请人地址: NL EINDHOVEN
- 专利权人: KONINKLIJKE PHILIPS ELECTRONICS, N.V.
- 当前专利权人: KONINKLIJKE PHILIPS ELECTRONICS, N.V.
- 当前专利权人地址: NL EINDHOVEN
- 优先权: EP05111941.0 20051212
- 国际申请: PCT/IB2006/054486 WO 20061128
- 主分类号: C40B60/04
- IPC分类号: C40B60/04 ; B01J19/00 ; B05D3/06
摘要:
The invention relates to a substrate material for analyzing fluids which has first areas with a high porosity and second areas with a lower porosity.