发明申请
US20080313583A1 Apparatus and Method for Testing Sub-Systems of a System-on-a-Chip Using a Configurable External System-on-a-Chip
有权
用于使用可配置的外部片上系统来测试片上系统的子系统的装置和方法
- 专利标题: Apparatus and Method for Testing Sub-Systems of a System-on-a-Chip Using a Configurable External System-on-a-Chip
- 专利标题(中): 用于使用可配置的外部片上系统来测试片上系统的子系统的装置和方法
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申请号: US12195716申请日: 2008-08-21
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公开(公告)号: US20080313583A1公开(公告)日: 2008-12-18
- 发明人: Kenneth O. Brinson , Sanjay Gupta , Binh T. Hoang , James M. Stafford
- 申请人: Kenneth O. Brinson , Sanjay Gupta , Binh T. Hoang , James M. Stafford
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
An apparatus and method are provided in which a previously verified SoC is coupled to a SoC under test via a communication bus or other type of communication interface. The previously verified SoC is provided with the same test stimuli as the SoC under test and thus, generates expected test results data. The test stimuli are sent to the SoC under test via a peripheral communication interface between the previously verified SoC and the SOC under test. The SoC under test generates actual test result data that is output to the previously verified SoC. The previously verified SoC may then compare the expected test results data with the actual test result data generated by the SoC under test to determine if they match. If the two sets of data do not match, then a mismatch notification may be generated and output.
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