发明申请
US20080317311A1 Coherent Scatter Imaging 审中-公开
相干散射成像

Coherent Scatter Imaging
摘要:
A region of interest is identified using a conventional CT or X-ray approach. Then, the region of interest is scanned using a plurality of pencil beams (28) to obtain a plurality of different scattered X-ray spectra. A geometric correction is then applied to each spectrum as if the spectrum was solely due to features in the region of interest. The various spectra recorded using the beams are combined and correlated to determine features of the region of interest (32) whilst minimising the effect of features in the rest of the sample (30).
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