发明申请
US20080319696A1 Method and Its System for Calibrating Measured Data Between Different Measuring Tools
有权
用于校准不同测量工具之间测量数据的方法及其系统
- 专利标题: Method and Its System for Calibrating Measured Data Between Different Measuring Tools
- 专利标题(中): 用于校准不同测量工具之间测量数据的方法及其系统
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申请号: US12137779申请日: 2008-06-12
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公开(公告)号: US20080319696A1公开(公告)日: 2008-12-25
- 发明人: Maki Tanaka , Wataru Nagatomo
- 申请人: Maki Tanaka , Wataru Nagatomo
- 优先权: JP2007-158621 20070615
- 主分类号: G01C25/00
- IPC分类号: G01C25/00
摘要:
The present invention relates to a method and its system for calibrating measured data between different measuring tools. A method of calibrating measured data between different measuring tools includes the steps of: measuring the CD average dimension and roughness of an object to be measured using a CD-SEM tool; calculating the number of the cross section measurement points required for calibration by statistically processing the roughness; measuring the cross section of the object to be measured using the cross section measuring tool to satisfy the number of the cross section measurement points, thereby calculating the CD average dimension of the cross section measurement height specified in the obtained cross section measurement result; and calculating a calibration correction value being a difference between the CD average dimension of the object and the CD average dimension of the cross section measurement height of the object.
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