Invention Application
US20090004803A1 MULTI-STAGE IMPLANT TO IMPROVE DEVICE CHARACTERISTICS 有权
多阶段植入物提高装置特性

MULTI-STAGE IMPLANT TO IMPROVE DEVICE CHARACTERISTICS
Abstract:
One aspect of the inventors' concept relates to a method of forming a semiconductor device. In this method, a gate structure is formed over a semiconductor body. A source/drain mask is patterned over the semiconductor body implanted source and drain regions are formed that are associated with the gate structure. After forming the implanted source and drain regions, a multi-stage implant is performed on the source and drain regions that comprises at least two implants where the dose and energy of the first implant varies from the dose and energy of the second implant. Other methods and devices are also disclosed.
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