Invention Application
- Patent Title: MULTI-STAGE IMPLANT TO IMPROVE DEVICE CHARACTERISTICS
- Patent Title (中): 多阶段植入物提高装置特性
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Application No.: US11769058Application Date: 2007-06-27
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Publication No.: US20090004803A1Publication Date: 2009-01-01
- Inventor: Manoj Mehrotra , Stan Ashburn , Shaoping Tang
- Applicant: Manoj Mehrotra , Stan Ashburn , Shaoping Tang
- Main IPC: G11C11/34
- IPC: G11C11/34 ; H01L21/8238

Abstract:
One aspect of the inventors' concept relates to a method of forming a semiconductor device. In this method, a gate structure is formed over a semiconductor body. A source/drain mask is patterned over the semiconductor body implanted source and drain regions are formed that are associated with the gate structure. After forming the implanted source and drain regions, a multi-stage implant is performed on the source and drain regions that comprises at least two implants where the dose and energy of the first implant varies from the dose and energy of the second implant. Other methods and devices are also disclosed.
Public/Granted literature
- US07691700B2 Multi-stage implant to improve device characteristics Public/Granted day:2010-04-06
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