Inspection systems and methods for their use are described, wherein the systems comprise: a movable carrier having a plurality of spaced receptacles, each spaced receptacle sized to accept a sample; a first pin positioned proximate to the movable carrier and connected to a first movable member capable of reciprocally moving the first pin alternately into and out of contact with a first end of a sample disposed in one of the spaced receptacles; a second pin positioned proximate to the movable carrier and connected to a second movable member capable of reciprocally moving the second pin alternately into and out of contact with a second end of the sample disposed in the one of the spaced receptacles; a measurement sensor capable of determining a value associated with the sample disposed in the one of the spaced receptacles; and an evaluation device in communication with the measurement sensor for receiving the value, the evaluation device providing a comparison between the value and a predetermined value.