发明申请
- 专利标题: Techniques For Generating Bit Reliability Information In A Post-Processor Using An Error Correction Constraint
- 专利标题(中): 使用误差校正约束在后处理器中生成位可靠性信息的技术
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申请号: US11771783申请日: 2007-06-29
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公开(公告)号: US20090006931A1公开(公告)日: 2009-01-01
- 发明人: Ivana Djurdjevic , Bruce Alexander Wilson , Mario Blaum , Richard Leo Galbraith , Ksenija Lakovic , Yuan Xing Lee , Zongwang Li , Travis Roger Oenning
- 申请人: Ivana Djurdjevic , Bruce Alexander Wilson , Mario Blaum , Richard Leo Galbraith , Ksenija Lakovic , Yuan Xing Lee , Zongwang Li , Travis Roger Oenning
- 申请人地址: NL Amsterdam
- 专利权人: Hitachi Global Storage Technologies Netherlands, B.V.
- 当前专利权人: Hitachi Global Storage Technologies Netherlands, B.V.
- 当前专利权人地址: NL Amsterdam
- 主分类号: G06F11/34
- IPC分类号: G06F11/34
摘要:
Techniques are provided that generate bit reliabilities for a detected sequence. A detector generates the detected sequence. According to one embodiment, a post-processor finds a first set of combinations of one or more error events in the detected sequence satisfying a complete set or a subset of error correction constraints corresponding to the first bit value, finds a second set of combinations of one or more error events in the detected sequence satisfying a complete set or a subset of error correction constraints corresponding to the second bit value, selects a first most likely combination of one or more events of the first set and a second most likely combination of one or more events of the second set, and generates a bit reliability based on the first and the second most likely values.
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