发明申请
US20090013192A1 INTEGRITY CHECK METHOD APPLIED TO ELECTRONIC DEVICE, AND RELATED CIRCUIT
审中-公开
适用于电子设备的完整性检查方法及相关电路
- 专利标题: INTEGRITY CHECK METHOD APPLIED TO ELECTRONIC DEVICE, AND RELATED CIRCUIT
- 专利标题(中): 适用于电子设备的完整性检查方法及相关电路
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申请号: US11772829申请日: 2007-07-03
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公开(公告)号: US20090013192A1公开(公告)日: 2009-01-08
- 发明人: Ping-Sheng Chen , Ming-Yang Chao , Chi-Chun Hsu , Yao-Dun Chang , Tse-Hong Wu
- 申请人: Ping-Sheng Chen , Ming-Yang Chao , Chi-Chun Hsu , Yao-Dun Chang , Tse-Hong Wu
- 主分类号: G06F12/14
- IPC分类号: G06F12/14
摘要:
An integrity check method applied to an electronic device includes: fetching at least one portion of external data into a specific memory, where the external data is stored within the electronic device; during fetching the portion of the external data into the specific memory, checking whether the size of the fetched data in the specific memory reaches a predetermined value, where the predetermined value is less than the total size of the external data; and when the size of the fetched data in the specific memory reaches the predetermined value, enabling an integrity check of the fetched data.
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