Invention Application
- Patent Title: POSITION/ORIENTATION MEASUREMENT METHOD AND APPARATUS
- Patent Title (中): 位置/方位测量方法和装置
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Application No.: US11815540Application Date: 2006-02-03
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Publication No.: US20090022369A1Publication Date: 2009-01-22
- Inventor: Kiyohide Satoh , Shinji Uchiyama , Takaaki Endo , Kenji Morita
- Applicant: Kiyohide Satoh , Shinji Uchiyama , Takaaki Endo , Kenji Morita
- Applicant Address: JP Tokyo
- Assignee: CANON KABUSHIKI KAISHA
- Current Assignee: CANON KABUSHIKI KAISHA
- Current Assignee Address: JP Tokyo
- Priority: JP2005-029827 20050204; JP2006-026177 20060202
- International Application: PCT/JP2006/301876 WO 20060203
- Main IPC: G06K9/46
- IPC: G06K9/46

Abstract:
This invention relates to a position/orientation measurement apparatus which can measure a position and orientation while achieving both high stability and precision. An image including indices laid out on a space is captured, and the indices are detected from the captured image. When a plurality of indices are detected, their distribution range is calculated, and an algorithm to be applied in position/orientation calculations is selected according to the size of the range (S3033, S3050, S3060). For example, when the indices are distributed over a sufficiently broad range, six parameters of the position and orientation of an image capture device are calculated as unknowns (S3070). As the distribution range of the indices becomes smaller, the degrees of freedom of unknown parameters to be calculated are reduced (S3035, S3025).
Public/Granted literature
- US08073201B2 Position/orientation measurement method and apparatus Public/Granted day:2011-12-06
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