发明申请
- 专利标题: POSITION/ORIENTATION MEASUREMENT METHOD AND APPARATUS
- 专利标题(中): 位置/方位测量方法和装置
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申请号: US11815540申请日: 2006-02-03
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公开(公告)号: US20090022369A1公开(公告)日: 2009-01-22
- 发明人: Kiyohide Satoh , Shinji Uchiyama , Takaaki Endo , Kenji Morita
- 申请人: Kiyohide Satoh , Shinji Uchiyama , Takaaki Endo , Kenji Morita
- 申请人地址: JP Tokyo
- 专利权人: CANON KABUSHIKI KAISHA
- 当前专利权人: CANON KABUSHIKI KAISHA
- 当前专利权人地址: JP Tokyo
- 优先权: JP2005-029827 20050204; JP2006-026177 20060202
- 国际申请: PCT/JP2006/301876 WO 20060203
- 主分类号: G06K9/46
- IPC分类号: G06K9/46
摘要:
This invention relates to a position/orientation measurement apparatus which can measure a position and orientation while achieving both high stability and precision. An image including indices laid out on a space is captured, and the indices are detected from the captured image. When a plurality of indices are detected, their distribution range is calculated, and an algorithm to be applied in position/orientation calculations is selected according to the size of the range (S3033, S3050, S3060). For example, when the indices are distributed over a sufficiently broad range, six parameters of the position and orientation of an image capture device are calculated as unknowns (S3070). As the distribution range of the indices becomes smaller, the degrees of freedom of unknown parameters to be calculated are reduced (S3035, S3025).
公开/授权文献
- US08073201B2 Position/orientation measurement method and apparatus 公开/授权日:2011-12-06
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