发明申请
US20090039387A1 SOLID-STATE IMAGING ELEMENT AND METHOD FOR MANUFACTURING THE SAME 有权
固态成像元件及其制造方法

  • 专利标题: SOLID-STATE IMAGING ELEMENT AND METHOD FOR MANUFACTURING THE SAME
  • 专利标题(中): 固态成像元件及其制造方法
  • 申请号: US12180920
    申请日: 2008-07-28
  • 公开(公告)号: US20090039387A1
    公开(公告)日: 2009-02-12
  • 发明人: Toru OkinoMitsuyoshi Mori
  • 申请人: Toru OkinoMitsuyoshi Mori
  • 优先权: JP2007-208903 20070810
  • 主分类号: H01L31/0336
  • IPC分类号: H01L31/0336 H01L31/18
SOLID-STATE IMAGING ELEMENT AND METHOD FOR MANUFACTURING THE SAME
摘要:
A solid-state imaging element includes a layered substrate made of silicon and composed of, for example, an N-type substrate, a P-type layer, and an N-type layer. In the layered substrate, an imaging region in which a plurality of pixels are arranged and a peripheral circuit region are formed. A recess reaching the reverse face of the P-type layer is formed in a reverse face portion of the layered substrate in the imaging region, and a reflective film is formed on at least the inner face of the recess. Light is reflected on the reverse face and the obverse face of the layered substrate.
信息查询
IPC分类:
H 电学
H01 基本电气元件
H01L 半导体器件;其他类目中不包括的电固体器件(使用半导体器件的测量入G01;一般电阻器入H01C;磁体、电感器、变压器入H01F;一般电容器入H01G;电解型器件入H01G9/00;电池组、蓄电池入H01M;波导管、谐振器或波导型线路入H01P;线路连接器、汇流器入H01R;受激发射器件入H01S;机电谐振器入H03H;扬声器、送话器、留声机拾音器或类似的声机电传感器入H04R;一般电光源入H05B;印刷电路、混合电路、电设备的外壳或结构零部件、电气元件的组件的制造入H05K;在具有特殊应用的电路中使用的半导体器件见应用相关的小类)
H01L31/00 对红外辐射、光、较短波长的电磁辐射,或微粒辐射敏感的,并且专门适用于把这样的辐射能转换为电能的,或者专门适用于通过这样的辐射进行电能控制的半导体器件;专门适用于制造或处理这些半导体器件或其部件的方法或设备;其零部件(H01L51/42优先;由形成在一共用衬底内或其上的多个固态组件,而不是辐射敏感元件与一个或多个电光源的结合所组成的器件入H01L27/00)
H01L31/0248 .以其半导体本体为特征的
H01L31/0256 ..以材料为特征的
H01L31/0264 ...无机材料
H01L31/0328 ....除掺杂或其他杂质外,包含已列入H01L31/0272至H01L31/032组中两组或更多个组的半导体材料
H01L31/0336 .....在不同半导体区域的,如Cu2X/CdX异质结,X为周期表中的Ⅵ族元素
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