Invention Application
- Patent Title: PRESENT POSITION LOCATING METHOD
- Patent Title (中): 现在位置定位方法
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Application No.: US12062183Application Date: 2008-04-03
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Publication No.: US20090040104A1Publication Date: 2009-02-12
- Inventor: Shinichi MITSUNAGA , Mikio NAGAHARA
- Applicant: Shinichi MITSUNAGA , Mikio NAGAHARA
- Applicant Address: JP Tokyo
- Assignee: SEIKO EPSON CORPORATION
- Current Assignee: SEIKO EPSON CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2007-101478 20070409; JP2008-037116 20080219
- Main IPC: G01S5/14
- IPC: G01S5/14

Abstract:
An evaluation point E of a present position candidate corresponding to each satellite set is calculated based on an a priori residual (APR) (APR value), a PDOP value, and the number of satellites of the target satellite set according to E=k1·f1(APR)+k2·f2(PDOP)+k3·f3(number of satellites). Evaluation coefficients k1 to k3 for respectively weighting evaluation functions f1 to f3 are determined based on an APR average value.
Public/Granted literature
- US07623069B2 Present position locating method Public/Granted day:2009-11-24
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