发明申请
- 专利标题： Sample enclosure for inspection and methods of use thereof
- 专利标题（中）： 用于检查的样品外壳及其使用方法
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申请号： US11660929申请日： 2005-08-25
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公开(公告)号： US20090045349A1公开(公告)日： 2009-02-19
- 发明人: David Sprinzak , Yiftah Karni , Yitzhak Ronen
- 申请人： David Sprinzak , Yiftah Karni , Yitzhak Ronen
- 国际申请： PCT/IL05/00919 WO 20050825
- 主分类号： G01N21/51
- IPC分类号： G01N21/51 ; G01K5/10
摘要：
A sample container assembly for use in a microscope including a sample enclosure, an electron beam permeable, fluid impermeable, membrane sealing the sample enclosure from a volume outside the sample enclosure and a pressure controller assembly communicating between the sample enclosure and a volume outside the sample enclosure.
信息查询
IPC分类:
