Invention Application
US20090046113A1 Uneven streaks evaluation device, uneven streaks evaluation method, storage medium, and color filter manufacturing method
审中-公开
不均匀条纹评估装置,不均匀条纹评估方法,存储介质和滤色器制造方法
- Patent Title: Uneven streaks evaluation device, uneven streaks evaluation method, storage medium, and color filter manufacturing method
- Patent Title (中): 不均匀条纹评估装置,不均匀条纹评估方法,存储介质和滤色器制造方法
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Application No.: US12220852Application Date: 2008-07-29
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Publication No.: US20090046113A1Publication Date: 2009-02-19
- Inventor: Takeshi Murakami , Eiji Yamada
- Applicant: Takeshi Murakami , Eiji Yamada
- Applicant Address: JP Osaka
- Assignee: Sharp Kabushiki Kaisha
- Current Assignee: Sharp Kabushiki Kaisha
- Current Assignee Address: JP Osaka
- Priority: JP199978/2007 20070731
- Main IPC: G09G5/02
- IPC: G09G5/02 ; G06K9/40 ; G03F1/00

Abstract:
A present uneven streaks evaluation device includes an evaluation data generation section for generating evaluation data, serving as an index for evaluating cyclic uneven streaks occurring on an evaluation target surface, in accordance with image data obtained by imaging the evaluation target surface to which light is emitted, wherein a one-dimensional projection processing section carries out a one-dimensional projection process with respect to light distribution included in the image data so that a projection direction is a direction including a vector of a direction in which uneven streaks occur, a power spectrum calculation section calculates a power spectrum in accordance with the light distribution having been subjected to the one-dimensional projection process, an integration processing section calculates an interval integral value of a preset cycle in accordance with the calculated power spectrum, and a noise component removing section removes a noise component included in the calculated interval integral value.
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