发明申请
US20090046113A1 Uneven streaks evaluation device, uneven streaks evaluation method, storage medium, and color filter manufacturing method
审中-公开
不均匀条纹评估装置,不均匀条纹评估方法,存储介质和滤色器制造方法
- 专利标题: Uneven streaks evaluation device, uneven streaks evaluation method, storage medium, and color filter manufacturing method
- 专利标题(中): 不均匀条纹评估装置,不均匀条纹评估方法,存储介质和滤色器制造方法
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申请号: US12220852申请日: 2008-07-29
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公开(公告)号: US20090046113A1公开(公告)日: 2009-02-19
- 发明人: Takeshi Murakami , Eiji Yamada
- 申请人: Takeshi Murakami , Eiji Yamada
- 申请人地址: JP Osaka
- 专利权人: Sharp Kabushiki Kaisha
- 当前专利权人: Sharp Kabushiki Kaisha
- 当前专利权人地址: JP Osaka
- 优先权: JP199978/2007 20070731
- 主分类号: G09G5/02
- IPC分类号: G09G5/02 ; G06K9/40 ; G03F1/00
摘要:
A present uneven streaks evaluation device includes an evaluation data generation section for generating evaluation data, serving as an index for evaluating cyclic uneven streaks occurring on an evaluation target surface, in accordance with image data obtained by imaging the evaluation target surface to which light is emitted, wherein a one-dimensional projection processing section carries out a one-dimensional projection process with respect to light distribution included in the image data so that a projection direction is a direction including a vector of a direction in which uneven streaks occur, a power spectrum calculation section calculates a power spectrum in accordance with the light distribution having been subjected to the one-dimensional projection process, an integration processing section calculates an interval integral value of a preset cycle in accordance with the calculated power spectrum, and a noise component removing section removes a noise component included in the calculated interval integral value.
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