发明申请
- 专利标题: Method and apparatus for performing three-dimensional measurement
- 专利标题(中): 用于进行三维测量的方法和装置
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申请号: US12230441申请日: 2008-08-28
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公开(公告)号: US20090066968A1公开(公告)日: 2009-03-12
- 发明人: Yasuyuki Ikeda , Shiro Fujieda , Hiroshi Yano
- 申请人: Yasuyuki Ikeda , Shiro Fujieda , Hiroshi Yano
- 专利权人: OMRON CORPORATION
- 当前专利权人: OMRON CORPORATION
- 优先权: JPP2007-222168 20070829
- 主分类号: G01B11/24
- IPC分类号: G01B11/24
摘要:
A control processing unit simultaneously drives cameras to produce images of a measuring object, the control processing unit searches corresponding point on a comparative image produced by one of the cameras for a representative point in a reference image produced by the other camera, and the control processing unit computes a three-dimensional coordinate corresponding to a coordinate using the coordinate of each point correlated by the search. The control processing unit also obtains a shift amount at the corresponding point specified by the search to an epipolar line specified based on a coordinate of a representative point on the reference image side or a parameter indicating a relationship between the cameras, and the control processing unit supplies the shift amount as an evaluation value indicating accuracy of three-dimensional measurement along with three-dimensional measurement result.
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