发明申请
US20090090908A1 Providing A Duplicate Test Signal Of An Output Signal Under Test In An Integrated Circuit
审中-公开
在集成电路中提供待测输出信号的重复测试信号
- 专利标题: Providing A Duplicate Test Signal Of An Output Signal Under Test In An Integrated Circuit
- 专利标题(中): 在集成电路中提供待测输出信号的重复测试信号
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申请号: US11868071申请日: 2007-10-05
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公开(公告)号: US20090090908A1公开(公告)日: 2009-04-09
- 发明人: Moises Cases , Bhyrav M. Mutnury , Nam H. Pham
- 申请人: Moises Cases , Bhyrav M. Mutnury , Nam H. Pham
- 申请人地址: US NY ARMONK
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY ARMONK
- 主分类号: G01R31/02
- IPC分类号: G01R31/02
摘要:
Providing a duplicate test signal of an output signal under test in an integrated circuit including selecting through a multiplexer an output signal under test, the output signal under test selected from a plurality of output signals of the integrated circuit; providing through the multiplexer a duplicate signal of the selected output signal under test; adding a high impedance load on the duplicate signal thereby reducing the amplitude of the duplicate signal; and amplifying the reduced duplicate signal thereby creating the duplicate test signal.