A built-in self repair (BISR) circuit for a multi-port memory and a method thereof are provided. The circuit includes a test-and-analysis module (TAM) and a defect locating module (DLM) coupled to the TAM. The TAM tests a repairable multi-port memory to generate a fault location and determines whether the test generates a port-specific fault candidate according to the fault location. If a port-specific fault candidate is generated, the DLM generates a defect location based on the fault location and provides the defect location to the TAM so that the TAM can determine how to repair the repairable multi-port memory according to the defect location. If no port-specific fault candidate is generated in the test, the TAM determines how to repair the repairable multi-port memory according to the fault location.