The invention concerns a method and apparatus for performing an accelerated simulation of mechanical stresses and strains to evaluate the reliability of a sub-miniature interconnect. The method can begin by determining at least one characteristic of at least one thermal cycle to which a sub-miniature interconnect having a predetermined configuration will be exposed. The at least one characteristic can be selected to include a temperature change during the at least one thermal cycle. Thereafter, at least one value is calculated which represents a dimensional variation in a substrate (400) to which the sub-miniature interconnect is bonded. In particular, the dimensional variation is a calculated variation in the substrate dimension caused by the thermal cycle. The dimensional variation can include a longitudinal dimensional variation aligned with a length of the ribbon or the wire or a lateral dimensional variation aligned transverse to the ribbon or wire.