发明申请
US20090121145A1 Particle detection circuit comprising basic circuits forming subpixels
有权
粒子检测电路,包括形成子像素的基本电路
- 专利标题: Particle detection circuit comprising basic circuits forming subpixels
- 专利标题(中): 粒子检测电路,包括形成子像素的基本电路
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申请号: US11665545申请日: 2005-10-27
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公开(公告)号: US20090121145A1公开(公告)日: 2009-05-14
- 发明人: Jean-Pierre Rostaing , Olivier Billoint , Patrick Audebert , Francis Glasser
- 申请人: Jean-Pierre Rostaing , Olivier Billoint , Patrick Audebert , Francis Glasser
- 申请人地址: FR Paris
- 专利权人: Commissariat A L'energie Atomique
- 当前专利权人: Commissariat A L'energie Atomique
- 当前专利权人地址: FR Paris
- 优先权: FR0411794 20041105
- 国际申请: PCT/FR2005/002694 WO 20051027
- 主分类号: G01T1/24
- IPC分类号: G01T1/24
摘要:
The particle detection circuit comprises a plurality of basic circuits. Each basic circuit comprises a particle detector element connected to an associated counter and a summing circuit having a first input connected to the output of the counter. Basic circuits, each forming a subpixel, are grouped together by series connection of their summing circuits to form a pixel. The output of the pixel, formed by the output of the summing circuit of a last basic circuit of the pixel, supplies counting signals representative of the number of particles detected by the set of basic circuits of the pixel. Disabling certain basic circuits of the pixel, by selective zero resetting of the first input of their summing circuit, can enable only the particles detected by certain zones of the pixel to be counted.
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