发明申请
US20090122934A1 Timing Measurement For Checking Probes 有权
检测探头的定时测量

  • 专利标题: Timing Measurement For Checking Probes
  • 专利标题(中): 检测探头的定时测量
  • 申请号: US12087727
    申请日: 2007-01-16
  • 公开(公告)号: US20090122934A1
    公开(公告)日: 2009-05-14
  • 发明人: Andrea FerrariRoberto Padovani
  • 申请人: Andrea FerrariRoberto Padovani
  • 优先权: ITBO2006A000031 20060118
  • 国际申请: PCT/EP2007/050419 WO 20070116
  • 主分类号: H04L7/00
  • IPC分类号: H04L7/00 G01B5/00
Timing Measurement For Checking Probes
摘要:
A system and a method for the transmission of signals representative of an event include a first low frequency clock (101) and a low frequency counter (102) for generating a first delay (TL), and a second high frequency clock (106) and a high frequency counter (104) for generating a second delay (TH). The system further includes a transmitter (105) for transmitting the representative signals after a delay from the event made up by the sum of the first and the second delay. The second delay can be generated also by an analogic device including for example a capacitor (99), and devices (97) for charging the capacitor up to the reaching of a preset voltage at its ends. A wireless transmission system according to the invention is utilized in a checking system with a contact detecting probe (1), for transmitting a signal representative of contact with the piece to be checked.
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