发明申请
- 专利标题： Proactive detection of metal whiskers in computer systems
- 专利标题（中）： 主动检测计算机系统中的金属晶须
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申请号： US11985288申请日： 2007-11-13
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公开(公告)号： US20090125467A1公开(公告)日： 2009-05-14
- 发明人: Ramakrishna C. Dhanekula , Kenny C. Gross , David K. McElfresh
- 申请人： Ramakrishna C. Dhanekula , Kenny C. Gross , David K. McElfresh
- 申请人地址： US CA Santa Clara
- 专利权人： Sun Microsystems, Inc.
- 当前专利权人： Sun Microsystems, Inc.
- 当前专利权人地址： US CA Santa Clara
- 主分类号： G01R29/08
- IPC分类号： G01R29/08 ; G06F15/18 ; G06F17/10 ; G06F19/00
摘要：
One embodiment of the present invention provides a system that proactively monitors and detects metal whisker growth in a target area within a computer system. During operation, the system collects target electromagnetic interference (EMI) signals using one or more antennas positioned in the vicinity of the target area. Next, the system analyzes the target EMI signals to proactively detect the onset of metal whisker growth in the target area.
公开/授权文献
- US08055594B2 Proactive detection of metal whiskers in computer systems 公开/授权日：2011-11-08
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