发明申请
US20090140299A1 MEMORY WITH HIGH DIELECTRIC CONSTANT ANTIFUSES ADAPTED FOR USE AT LOW VOLTAGE
有权
具有适用于低电压使用的高介电常数抗体的存储器
- 专利标题: MEMORY WITH HIGH DIELECTRIC CONSTANT ANTIFUSES ADAPTED FOR USE AT LOW VOLTAGE
- 专利标题(中): 具有适用于低电压使用的高介电常数抗体的存储器
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申请号: US12367214申请日: 2009-02-06
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公开(公告)号: US20090140299A1公开(公告)日: 2009-06-04
- 发明人: Xiaoyu Yang , Roy E. Scheuerlein , Feng Li , Albert T. Meeks
- 申请人: Xiaoyu Yang , Roy E. Scheuerlein , Feng Li , Albert T. Meeks
- 申请人地址: US CA Milpitas
- 专利权人: SANDISK 3D LLC
- 当前专利权人: SANDISK 3D LLC
- 当前专利权人地址: US CA Milpitas
- 主分类号: H01L29/66
- IPC分类号: H01L29/66 ; H01L23/525
摘要:
A memory array having memory cells comprising a diode and an antifuse can be made smaller and programmed at lower voltage by using an antifuse material having a higher dielectric constant and a higher acceleration factor than those of silicon dioxide, and by using a diode having a lower band gap than that of silicon. Such memory arrays can be made to have long operating lifetimes by using the high acceleration factor and lower band gap materials. Antifuse materials having dielectric constants between 5 and 27, for example, hafnium silicon oxynitride or hafnium silicon oxide, are particularly effective. Diode materials with band gaps lower than that of silicon, such as germanium or a silicon-germanium alloy, are particularly effective.
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