发明申请
- 专利标题: Interference Exclusion Capability Testing Apparatus
- 专利标题(中): 干扰排除能力测试仪
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申请号: US12084451申请日: 2006-10-26
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公开(公告)号: US20090140750A1公开(公告)日: 2009-06-04
- 发明人: Toshihiro Sugiura , Masamune Takeda , Junichi Takahashi
- 申请人: Toshihiro Sugiura , Masamune Takeda , Junichi Takahashi
- 申请人地址: JP Nisshin-shi
- 专利权人: MASPRODENKON KABUSHIKIKAISHA
- 当前专利权人: MASPRODENKON KABUSHIKIKAISHA
- 当前专利权人地址: JP Nisshin-shi
- 优先权: JP2005-313405 20051027
- 国际申请: PCT/JP2006/321408 WO 20061026
- 主分类号: G01R31/00
- IPC分类号: G01R31/00
摘要:
An interference exclusion capability testing apparatus is provided for use in testing interference exclusion capability of a specimen by radiating an electromagnetic wave toward the specimen from a radiating antenna. The radiating antenna includes an electromagnetic horn, and a waveguide plate that guides an electromagnetic wave radiated from the electromagnetic horn to the specimen.
公开/授权文献
- US07999560B2 Interference exclusion capability testing apparatus 公开/授权日:2011-08-16