发明申请
US20090146258A1 SELF-ALIGNED VERTICAL PNP TRANSISTOR FOR HIGH PERFORMANCE SiGe CBiCMOS PROCESS
有权
用于高性能SiGe CBiCMOS工艺的自对准垂直PNP晶体管
- 专利标题: SELF-ALIGNED VERTICAL PNP TRANSISTOR FOR HIGH PERFORMANCE SiGe CBiCMOS PROCESS
- 专利标题(中): 用于高性能SiGe CBiCMOS工艺的自对准垂直PNP晶体管
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申请号: US12368283申请日: 2009-02-09
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公开(公告)号: US20090146258A1公开(公告)日: 2009-06-11
- 发明人: Shaoqiang ZHANG , Purakh Raj VERMA , Sanford CHU
- 申请人: Shaoqiang ZHANG , Purakh Raj VERMA , Sanford CHU
- 申请人地址: SG Singapore
- 专利权人: CHARTERED SEMICONDUCTOR MANUFACTURING, LTD.
- 当前专利权人: CHARTERED SEMICONDUCTOR MANUFACTURING, LTD.
- 当前专利权人地址: SG Singapore
- 主分类号: H01L29/72
- IPC分类号: H01L29/72 ; H01L21/8238 ; H01L21/8249
摘要:
A structure and a process for a self-aligned vertical PNP transistor for high performance SiGe CBiCMOS process. Embodiments include SiGe CBiCMOS with high-performance SiGe NPN transistors and PNP transistors. As the PNP transistors and NPN transistors contained different types of impurity profile, they need separate lithography and doping step for each transistor. The process is easy to integrate with existing CMOS process to save manufacturing time and cost. As plug-in module, fully integration with SiGe BiCMOS processes. High doping Polysilicon Emitter can increase hole injection efficiency from emitter to base, reduce emitter resistor, and form very shallow EB junction. Self-aligned N+ base implant can reduce base resistor and parasitical EB capacitor. Very low collector resistor benefits from BP layer. PNP transistor can be Isolated from other CMOS and NPN devices by BNwell, Nwell and BN+ junction.
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