发明申请
US20090147355A1 Microscope calibration apparatus and method and stage including calibration apparatus 有权
显微镜校准装置及方法及阶段包括校准装置

  • 专利标题: Microscope calibration apparatus and method and stage including calibration apparatus
  • 专利标题(中): 显微镜校准装置及方法及阶段包括校准装置
  • 申请号: US11953598
    申请日: 2007-12-10
  • 公开(公告)号: US20090147355A1
    公开(公告)日: 2009-06-11
  • 发明人: Robert Jennings
  • 申请人: Robert Jennings
  • 主分类号: G02B21/26
  • IPC分类号: G02B21/26
Microscope calibration apparatus and method and stage including calibration apparatus
摘要:
A stage for supporting a specimen slide and for calibrating a microscope includes a base and a calibration component integral with the base. The calibration component includes at least one calibration element for positional calibration and at least one calibration element for optical calibration. Calibration of the microscope can be performed without the need for independent calibration slides. The calibration component may be a glass calibration component or may be defined by a calibration element formed or etched through the base.
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