发明申请
US20090161122A1 Targeted Artifacts and Methods for Evaluating 3-D Coordinate System Measurement Accuracy of Optical 3-D Measuring Systems using Such Targeted Artifacts
有权
用于评估使用这种目标人工制品的光学三维测量系统的三维坐标系测量精度的目标人工制品和方法
- 专利标题： Targeted Artifacts and Methods for Evaluating 3-D Coordinate System Measurement Accuracy of Optical 3-D Measuring Systems using Such Targeted Artifacts
- 专利标题（中）： 用于评估使用这种目标人工制品的光学三维测量系统的三维坐标系测量精度的目标人工制品和方法
-
申请号： US11962278申请日： 2007-12-21
-
公开(公告)号： US20090161122A1公开(公告)日： 2009-06-25
- 发明人: Jesse R. Boyer , Jeffry K. Pearson , Randall W. Joyner , Joseph D. Drescher
- 申请人： Jesse R. Boyer , Jeffry K. Pearson , Randall W. Joyner , Joseph D. Drescher
- 申请人地址： US CT Hartford
- 专利权人： UNITED TECHNOLOGIES CORP.
- 当前专利权人： UNITED TECHNOLOGIES CORP.
- 当前专利权人地址： US CT Hartford
- 主分类号： G01B11/14
- IPC分类号： G01B11/14
摘要：
A method for evaluating three-dimensional (3-D) coordinate system measurement accuracy of an optical 3-D measuring system using targeted artifacts is provided. In this regard, an exemplary embodiment of a method for evaluating 3-D coordinate system measurement accuracy using targeted artifacts comprises: taking a series of measurements from different positions and orientations using target dots on a targeted artifact with an optical 3-D measuring system; and calculating measurement errors using the series of measurements. An exemplary embodiment of a targeted artifact used with the method includes a base and target dots located on the base.