Invention Application
- Patent Title: Classification Apparatus and Fine Particle Measuring Apparatus
- Patent Title (中): 分类仪器和微粒测量仪器
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Application No.: US12158650Application Date: 2006-12-22
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Publication No.: US20090173670A1Publication Date: 2009-07-09
- Inventor: Daiji Okuda , Hiroshi Okuda , Fujio Inoue
- Applicant: Daiji Okuda , Hiroshi Okuda , Fujio Inoue
- Applicant Address: JP Kyoto-shi, Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto-shi, Kyoto
- Priority: JP2005-369776 20051222
- International Application: PCT/JP2006/325593 WO 20061222
- Main IPC: B03C7/02
- IPC: B03C7/02 ; B07C5/08

Abstract:
A classification apparatus for classifying and separating particles having particle sizes within a predetermined range is disclosed. In a preferred embodiment of the classification apparatus, a center electrode (3) and an outside electrode (4) generate an electric field for classifying charged fine particles according to electric mobility. In the upper part of a housing (1), a sheath gas supply portion (7) is provided. An aerosol supply portion (11) has an introduction port (11a) provided on the outside electrode (4) side in a classification region (5), and supplies a charged aerosol at a constant flow rate through the introduction port (11a). On the downstream side in the flow of a sheath gas in the classification region (5), a larger-size particle discharge portion (13) is provided. The larger-size particle discharge portion (13) has a discharge port (13a) provided on the outside electrode (4) side, and discharges charged fine particles, which are contained in the classified charged aerosol and have particle sizes larger than a predetermined particle size, together with part of the sheath gas at a constant flow rate. A detector (18) is provided downstream of the housing (1) to detect the number of remaining charged fine particles contained in the sheath gas introduced thereinto as the quantity of electricity.
Public/Granted literature
- US07880109B2 Classification apparatus and fine particle measuring apparatus Public/Granted day:2011-02-01
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