发明申请
- 专利标题: BONDING STRENGTH MEASURING DEVICE
- 专利标题(中): 粘结强度测量装置
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申请号: US12350643申请日: 2009-01-08
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公开(公告)号: US20090175312A1公开(公告)日: 2009-07-09
- 发明人: Yi-Shao Lai , Tsung-Yueh Tsai , Hsiao-Chuan Chang
- 申请人: Yi-Shao Lai , Tsung-Yueh Tsai , Hsiao-Chuan Chang
- 申请人地址: TW Kaohsiung
- 专利权人: Advanced Semiconductor Engineering, Inc.
- 当前专利权人: Advanced Semiconductor Engineering, Inc.
- 当前专利权人地址: TW Kaohsiung
- 优先权: TW97100870 20080109
- 主分类号: G01N3/00
- IPC分类号: G01N3/00
摘要:
A bonding strength measuring device for measuring the bonding strength between a substrate and a molding compound disposed on the substrate is provided. The measuring device includes a heating platform, a heating slide plate, and a fixing bracket. The heating platform has a first heating area and a first replaceable fixture. The substrate is disposed on the first heating area, and the first replaceable fixture is used to fix the substrate and has an opening exposing the molding compound. The heating slide plate has a second heating area and a second replaceable fixture. The second heating area is used to heat the molding compound, and the second replaceable fixture has a cavity for accommodating the molding compound. The fixing bracket is used to fix the heating slide plate above the heating platform.
公开/授权文献
- US07980757B2 Bonding strength measuring device 公开/授权日:2011-07-19
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