发明申请
US20090191471A1 Composition for cleaning a phase shift mask and associated methods
审中-公开
用于清洗相移掩模和相关方法的组合物
- 专利标题: Composition for cleaning a phase shift mask and associated methods
- 专利标题(中): 用于清洗相移掩模和相关方法的组合物
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申请号: US12318510申请日: 2008-12-30
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公开(公告)号: US20090191471A1公开(公告)日: 2009-07-30
- 发明人: Dong-Hun Lee , Hae-Young Jeong , Sung-Jae Han , Han-Shin Lee
- 申请人: Dong-Hun Lee , Hae-Young Jeong , Sung-Jae Han , Han-Shin Lee
- 优先权: KR2007-141297 20071231
- 主分类号: G03F1/00
- IPC分类号: G03F1/00 ; C11D7/18
摘要:
A composition for cleaning a phase shift mask, including an organic acid ammonium salt, wherein a base ionization constant (Kb) of organic acid ions is larger than an acid ionization constant (Ka) of ammonium ions, hydrogen peroxide, and water, and associated methods.