发明申请
US20090192713A1 Determining Structural Dip and Azimuth From LWD Resistivity Measurements in Anisotropic Formations
有权
确定各向异性层中LWD电阻率测量的结构浸渍和方位角
- 专利标题： Determining Structural Dip and Azimuth From LWD Resistivity Measurements in Anisotropic Formations
- 专利标题（中）： 确定各向异性层中LWD电阻率测量的结构浸渍和方位角
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申请号： US12356430申请日： 2009-01-20
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公开(公告)号： US20090192713A1公开(公告)日： 2009-07-30
- 发明人: Sheng Fang , Gulamabbas Merchant , Eric Hart , Andrew D. Kirkwood , Tsili Wang
- 申请人： Sheng Fang , Gulamabbas Merchant , Eric Hart , Andrew D. Kirkwood , Tsili Wang
- 申请人地址： US TX Houston
- 专利权人： Baker Hughes Incorporated
- 当前专利权人： Baker Hughes Incorporated
- 当前专利权人地址： US TX Houston
- 主分类号： G01V3/30
- IPC分类号： G01V3/30 ; G01V3/00
摘要：
Cross-component measurements in combination with standard propagation resistivity measurements are processed to estimate the vertical and horizontal resistivities, relative dip and relative azimuth of an anisotropic earth formation.
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