Invention Application
- Patent Title: Method and System for Improving Accuracy in Autorefraction Measurements by including Measurement Distance Between the Photoreceptors and the Scattering Location in an Eye
- Patent Title (中): 通过包括感光体之间的测量距离和眼睛中的散射位置来提高自动折射测量精度的方法和系统
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Application No.: US12388253Application Date: 2009-02-18
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Publication No.: US20090207377A1Publication Date: 2009-08-20
- Inventor: Richard J. Copland
- Applicant: Richard J. Copland
- Applicant Address: US NM Albuquerque
- Assignee: AMO Wavefront Sciences, LLC
- Current Assignee: AMO Wavefront Sciences, LLC
- Current Assignee Address: US NM Albuquerque
- Main IPC: A61B3/028
- IPC: A61B3/028 ; A61B3/103
Abstract:
A method and associated system improve accuracy in objective refraction measurements by including the measured distance between the photoreceptors of a subjects eye and the scattering location of light during the objective refraction measurements. Chromatic aberrations in the objective measurements are also compensated. The distance between the photoreceptors and the scattering location may be determined by adjusting a distance between a rotating speckled light pattern and an eye until the speckled light pattern appears to be stationary, or by employing a Scheiner disk.
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