发明申请
US20090222647A1 Method and Apparatus for Reducing Test Case Generation Time in Processor Testing
有权
用于降低处理器测试中测试用例生成时间的方法和设备
- 专利标题: Method and Apparatus for Reducing Test Case Generation Time in Processor Testing
- 专利标题(中): 用于降低处理器测试中测试用例生成时间的方法和设备
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申请号: US12041071申请日: 2008-03-03
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公开(公告)号: US20090222647A1公开(公告)日: 2009-09-03
- 发明人: Guo H. Feng , Pedro Martin-de-Nicolas
- 申请人: Guo H. Feng , Pedro Martin-de-Nicolas
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 主分类号: G06F9/00
- IPC分类号: G06F9/00
摘要:
A method, apparatus and computer program product are provided for use in a system that includes one or more processors, and multiple threads that are respectively associated with the one or more processors. One embodiment of the invention is directed to a method that includes the steps of generating one or more test cases, wherein each test case comprises a specified set of instructions in a specified order, and defining a plurality of thread hardware allocations, each corresponding to a different one of the threads. The thread hardware allocation corresponding to a given thread comprises a set of processor hardware resources that are allocated to the given thread for use in executing test cases. The method further includes executing a particular one of the test cases on a first thread hardware allocation, in order to provide a first set of test data, and thereafter executing the particular test case using a second thread hardware allocation, in order to provide a second set of test data.
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