发明申请
- 专利标题: TEST APPARATUS, TEST METHOD, AND MANUFACTURING METHOD
- 专利标题(中): 测试装置,测试方法和制造方法
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申请号: US12469857申请日: 2009-05-21
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公开(公告)号: US20090224778A1公开(公告)日: 2009-09-10
- 发明人: Kazuhiro Sato , Manabu Kai
- 申请人: Kazuhiro Sato , Manabu Kai
- 申请人地址: JP Kawasaki-shi
- 专利权人: FUJITSU LIMITED
- 当前专利权人: FUJITSU LIMITED
- 当前专利权人地址: JP Kawasaki-shi
- 优先权: JP2006-322947 20061130
- 主分类号: G01R31/302
- IPC分类号: G01R31/302 ; H01R43/00
摘要:
An apparatus includes: a strip line cell 100 having a first conductor board that has the width larger than the width of RFID tag T1 that receives a predetermined radio wave signal and reacts, to which first conductor board an electric signal that corresponds to the radio wave signal is supplied from outside, and a second conductor board opposed to the first conductor board, wherein the RFID tag T1 is arranged on other side with the opposite side opposed to the second conductor board, of the first conductor board that transmits the radio wave signal with an output according to an electric power that the electric signal possesses; a reader writer 20 that supplies the electric signal to the first conductor board of the strip line cell 100; and a computer 30 that confirms presence of reaction in the RFID tag T1.
公开/授权文献
- US08217672B2 Test apparatus, test method, and manufacturing method 公开/授权日:2012-07-10
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