发明申请
- 专利标题: CONTACT TYPE MEASURING INSTRUMENT
- 专利标题(中): 接触式测量仪器
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申请号: US12335688申请日: 2008-12-16
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公开(公告)号: US20090235397A1公开(公告)日: 2009-09-17
- 发明人: Yonpyo HON , Kenzo EBIHARA , Akira YAMAMOTO , Masayuki HAMURA
- 申请人: Yonpyo HON , Kenzo EBIHARA , Akira YAMAMOTO , Masayuki HAMURA
- 申请人地址: JP Minamitsuru-gun
- 专利权人: FANUC LTD
- 当前专利权人: FANUC LTD
- 当前专利权人地址: JP Minamitsuru-gun
- 优先权: JP2008-063223 20080312
- 主分类号: G01N13/22
- IPC分类号: G01N13/22
摘要:
There is provided a contact type measuring instrument in which the contact force of a probe is adjusted by a force created by compressed air and an attraction force between a permanent magnet and a magnetic body. This measuring instrument gives a pulling-in force or a pushing-out force to the probe by controlling a fluid pressure in a probe body. Also, between the permanent magnet attached to the tip end of a movable part of a micrometer attached to the probe body and a plate-shaped member attached to the end part on the side opposite to a contact of the probe, an attraction force according to a distance between the permanent magnet and the plate-shaped member is created.
公开/授权文献
- US07797850B2 Contact type measuring instrument 公开/授权日:2010-09-21
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