发明申请
- 专利标题： Microchip and sample analysis method
- 专利标题（中）： Microchip和样品分析方法
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申请号： US12385081申请日： 2009-03-30
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公开(公告)号： US20090242754A1公开(公告)日： 2009-10-01
- 发明人: Hisao Kawaura
- 申请人： Hisao Kawaura
- 申请人地址： JP Tokyo
- 专利权人： NEC Corporation
- 当前专利权人： NEC Corporation
- 当前专利权人地址： JP Tokyo
- 优先权： JP092900/2008 20080331
- 主分类号： H01J49/26
- IPC分类号： H01J49/26
摘要：
The present invention provides a microchip and a sample analysis method in which mass analysis of a separated sample can be performed with high sensitivity without damaging resolution of a microchip. A microchip includes a channel formed on a substrate and sample collection portions which are formed along the channel, apart from the channel and are apart from each other.
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