发明申请
- 专利标题： SEMICONDUCTOR DEVICE AND OPERATION MONITORING METHOD FOR SEMICONDUCTOR DEVICE
- 专利标题（中）： 半导体器件的半导体器件和操作监控方法
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申请号： US12410157申请日： 2009-03-24
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公开(公告)号： US20090243627A1公开(公告)日： 2009-10-01
- 发明人: Kazufumi KOMURA , Katsumi Furukawa , Keiichi Fujimura , Takayoshi Nakamura , Tohru Yasuda , Hirohisa Nishiyama , Nobuyoshi Nakaya , Kanta Yamamoto , Shigetaka Asano
- 申请人： Kazufumi KOMURA , Katsumi Furukawa , Keiichi Fujimura , Takayoshi Nakamura , Tohru Yasuda , Hirohisa Nishiyama , Nobuyoshi Nakaya , Kanta Yamamoto , Shigetaka Asano
- 申请人地址： JP Tokyo
- 专利权人： FUJITSU MICROELECTRONICS LIMITED
- 当前专利权人： FUJITSU MICROELECTRONICS LIMITED
- 当前专利权人地址： JP Tokyo
- 优先权： JP2008-92752 20080331
- 主分类号： G01R31/02
- IPC分类号： G01R31/02
摘要：
A semiconductor device includes a monitor including a first element coupled between a first power supply line and a second power supply line, and a load for increasing a load value between the first element and the first power supply line or the second power supply line, and a determination unit which determines an operating state of the first element based on an output of the monitor.