Embodiments of the present invention help to prevent dropout of a head slider from an micro electrical mechanical system (MEMS) and damage of the MEMS. In an embodiment of the present invention, a suspension for a slider dynamic electric test (DET) comprises an MEMS for supporting a head slider. The MEMS has a clamper for holding a head slider and the clamper moved by an external force can attach or detach a head slider. The suspension comprises limiters for limiting the clamper's lateral movement. The limiters limit the clamper's undesirable movement, which prevents the clamper's lateral movement in attaching a head slider, a head slider's dropout and the MEMS's damage caused by a contact with a magnetic disk, or a head slider's dropout and the MEMS's damage in handling.