发明申请
- 专利标题： ION ATTACHMENT MASS SPECTROMETER AND ION ATTACHMENT MASS SPECTROMETRY METHOD THEREOF
- 专利标题（中）： 离子质谱仪和离子附着质谱分析方法
-
申请号： US12427000申请日： 2009-04-21
-
公开(公告)号： US20090266979A1公开(公告)日： 2009-10-29
- 发明人: Megumi Nakamura , Yoshiro Shiokawa , Yasuyuki Taneda
- 申请人： Megumi Nakamura , Yoshiro Shiokawa , Yasuyuki Taneda
- 申请人地址： JP Kawasaki-shi
- 专利权人： CANON ANELVA TECHNIX CORPORATION
- 当前专利权人： CANON ANELVA TECHNIX CORPORATION
- 当前专利权人地址： JP Kawasaki-shi
- 优先权： JP2008-115321 20080425
- 主分类号： B01D59/44
- IPC分类号： B01D59/44
摘要：
An ion attachment mass spectrometer includes an attached ion generation unit which generates attached ions by attaching positively charged metal ions to the molecules of a measurement target substance, and a mass spectrometry unit which performs mass spectrometry of the attached ions. The mass spectrometry unit includes a mass separation chamber to select attached ions having a specific mass number from the attached ions, an ionization chamber to dissociate the attached ions having the specific mass number, and a mass analysis chamber to analyze the dissociated ions.
信息查询
