发明申请
- 专利标题: WAVEFORM SHAPING DEVICE AND ERROR MEASUREMENT DEVICE
- 专利标题(中): 波形形状装置和误差测量装置
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申请号: US12295227申请日: 2007-03-26
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公开(公告)号: US20090279595A1公开(公告)日: 2009-11-12
- 发明人: Kazuhiro Yamane , Kazuhiro Fujinuma
- 申请人: Kazuhiro Yamane , Kazuhiro Fujinuma
- 申请人地址: JP Atsugi-shi
- 专利权人: ANRITSU CORPORATION
- 当前专利权人: ANRITSU CORPORATION
- 当前专利权人地址: JP Atsugi-shi
- 优先权: JP2006-099908 20060331
- 国际申请: PCT/JP2007/056243 WO 20070326
- 主分类号: H04B17/00
- IPC分类号: H04B17/00
摘要:
The object of the present invention is to provide a waveform shaping device and an error measurement device which can perform a waveform shaping operation with the sufficient amplitude margin, even if the mark ratio of the inputted data signal is significantly varied and the amplitude of the inputted data signal is decreased. The waveform shaping device according to the present invention comprises a voltage detector (22) for detecting an inputted data signal (Da) to obtain an amplitude value and the center amplitude voltage of the inputted data signal (Da), a reference voltage generator (23) for generate the reference voltage corresponding to the center amplitude voltage, and a comparator (25) for comparing the inputted data signal (Da) with the reference voltage, and in which the waveform shaping device further comprises a correction information outputting section (27) for outputting correction information V on the basis of a mark ratio (M) and an amplitude of the inputted data signal (Da), the correction information V used to correct the center amplitude voltage detected by the voltage detector (22), and a correction section (28) correct the reference voltage or the inputted data signal to be inputted to the comparator (25) on the basis of the correction information (V).
公开/授权文献
- US08005134B2 Waveform shaping device and error measurement device 公开/授权日:2011-08-23
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