发明申请
- 专利标题: System and Method for Synchronized Measurements
- 专利标题(中): 用于同步测量的系统和方法
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申请号: US12126606申请日: 2008-05-23
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公开(公告)号: US20090292485A1公开(公告)日: 2009-11-26
- 发明人: John C. Van Gorp , Jon A. Bickel , Peter Cowan , Hubert Lindsay
- 申请人: John C. Van Gorp , Jon A. Bickel , Peter Cowan , Hubert Lindsay
- 主分类号: G01R29/00
- IPC分类号: G01R29/00
摘要:
A system and method of synchronizing measurements between a master monitor (130 and/or 132) and a slave monitor (154 and/or 164). A system controller (110) receives master samples representing a signal characteristic from the master monitor (130 and/or 132) and slave samples representing the signal characteristic from the slave monitor (154 and/or 164). The master samples and slave samples are aligned using correlation analysis to obtain the identification of a slave sample that aligns with a predetermined master sample. This identification is transmitted to the slave monitor and used to synchronize a master measurement with a slave measurement.
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