发明申请
- 专利标题: Three-Dimensional Integrated Circuits and Techniques for Fabrication Thereof
- 专利标题(中): 三维集成电路及其制造技术
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申请号: US12131988申请日: 2008-06-03
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公开(公告)号: US20090294814A1公开(公告)日: 2009-12-03
- 发明人: Solomon Assefa , Kuan-Neng Chen , Steven J. Koester , Yurii A. Vlasov
- 申请人: Solomon Assefa , Kuan-Neng Chen , Steven J. Koester , Yurii A. Vlasov
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 主分类号: H01L31/00
- IPC分类号: H01L31/00 ; H01L21/00
摘要:
Integrated circuits having complementary metal-oxide semiconductor (CMOS) and photonics circuitry and techniques for three-dimensional integration thereof are provided. In one aspect, a three-dimensional integrated circuit comprises a bottom device layer and a top device layer. The bottom device layer comprises a substrate; a digital CMOS circuitry layer adjacent to the substrate; and a first bonding oxide layer adjacent to a side of the digital CMOS circuitry layer opposite the substrate. The top device layer comprises an analog CMOS and photonics circuitry layer formed in a silicon-on-insulator (SOI) layer having a buried oxide (BOX) with a thickness of greater than or equal to about 0.5 micrometers; and a second bonding oxide layer adjacent to the analog CMOS and photonics circuitry layer. The bottom device layer is bonded to the top device layer by an oxide-to-oxide bond between the first bonding oxide layer and the second bonding oxide layer.
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