Invention Application
- Patent Title: Memory And Writing Method Thereof
- Patent Title (中): 记忆和写作方法
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Application No.: US12344709Application Date: 2008-12-29
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Publication No.: US20090296450A1Publication Date: 2009-12-03
- Inventor: Shyh-Shyuan Sheu , Lieh-Chiu Lin , Pei-Chia Chiang , Wen-Pin Lin
- Applicant: Shyh-Shyuan Sheu , Lieh-Chiu Lin , Pei-Chia Chiang , Wen-Pin Lin
- Applicant Address: TW Chutung TW Hsin-Chu TW Kueishan TW Hsinchu TW Hsinchu
- Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE,POWERCHIP SEMICONDUCTOR CORP.,NANYA TECHNOLOGY CORPORATION,PROMOS TECHNOLOGIES INC.,WINBOND ELECTRONICS CORP.
- Current Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE,POWERCHIP SEMICONDUCTOR CORP.,NANYA TECHNOLOGY CORPORATION,PROMOS TECHNOLOGIES INC.,WINBOND ELECTRONICS CORP.
- Current Assignee Address: TW Chutung TW Hsin-Chu TW Kueishan TW Hsinchu TW Hsinchu
- Priority: TW097120428 20080602
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C7/00 ; G11C5/14

Abstract:
A memory having a memory cell, a resistance estimator and a write current generator. The resistance estimator is coupled to the memory cell to estimate the resistance of the memory cell and outputs an estimated resistance level. According to the estimated resistance level, the write current generator generates a write current to flow through the memory cell and to change the resistance of the memory cell. The write current is in a pulse form, and the write current generator sets the pulse width, or magnitude, or both the pulse width and the magnitude of the write current according to the estimated resistance level.
Public/Granted literature
- US07889547B2 Memory and writing method thereof Public/Granted day:2011-02-15
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