发明申请
- 专利标题: WAFER PROCESSING DEPOSITION SHIELDING COMPONENTS
- 专利标题(中): 波浪加工沉积屏蔽部件
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申请号: US12482846申请日: 2009-06-11
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公开(公告)号: US20090308739A1公开(公告)日: 2009-12-17
- 发明人: Martin Lee Riker , Maurice E. Ewert , Anantha K. Subramani
- 申请人: Martin Lee Riker , Maurice E. Ewert , Anantha K. Subramani
- 申请人地址: US CA Santa Clara
- 专利权人: APPLIED MATERIALS, INC.
- 当前专利权人: APPLIED MATERIALS, INC.
- 当前专利权人地址: US CA Santa Clara
- 主分类号: C23C14/34
- IPC分类号: C23C14/34
摘要:
Embodiments described herein generally relate to an apparatus and method for uniform sputter depositing of materials into the bottom and sidewalls of high aspect ratio features on a substrate. In one embodiment, a collimator for mechanical and electrical coupling with a shield member positioned between a sputtering target and a substrate support pedestal is provided. The collimator comprises a central region and a peripheral region, wherein the collimator has a plurality of apertures extending therethrough and where the apertures located in the central region have a higher aspect ratio than the apertures located in the peripheral region.
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