发明申请
US20090315569A1 IMPEDANCE MEASURING INSTRUMENT AND IMPEDANCE MEASURING METHOD FOR FINE PARTICLE COLLECTOR
审中-公开
用于微粒收集器的阻抗测量仪和阻抗测量方法
- 专利标题: IMPEDANCE MEASURING INSTRUMENT AND IMPEDANCE MEASURING METHOD FOR FINE PARTICLE COLLECTOR
- 专利标题(中): 用于微粒收集器的阻抗测量仪和阻抗测量方法
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申请号: US12548737申请日: 2009-08-27
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公开(公告)号: US20090315569A1公开(公告)日: 2009-12-24
- 发明人: Kyosuke Katsuyama , Kenshin Kitoh , Takeshi Sakuma
- 申请人: Kyosuke Katsuyama , Kenshin Kitoh , Takeshi Sakuma
- 申请人地址: JP Nagoya-City
- 专利权人: NGK Insulators, Ltd.
- 当前专利权人: NGK Insulators, Ltd.
- 当前专利权人地址: JP Nagoya-City
- 优先权: JP2007-083326 20070328
- 主分类号: G01R27/28
- IPC分类号: G01R27/28
摘要:
An impedance measuring instrument of a fine particle collector comprising a fine particle collection body for collecting fine particles in a fluid, a conductive can body for containing the fine particle collection body, and a buffering body disposed between the fine particle collection body and the conductive can body, wherein two or more electrodes are arranged on the fine particle collection body, at least one of the electrodes is connected with an AC power supply, at least the other electrode is connected with an ammeter, the AC power supply and the ammeter are interconnected and further connected with the conducive can body, and the conducive can body is grounded.
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