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Invention Application
US20100014093A1 Measurements of Optical Inhomogeneity and Other Properties in Substances Using Propagation Modes of Light 有权
光学不均匀性的测量及物质的其他性质

  • Patent Title: Measurements of Optical Inhomogeneity and Other Properties in Substances Using Propagation Modes of Light
  • Patent Title (中): 光学不均匀性的测量及物质的其他性质
  • Application No.: US12569835
    Application Date: 2009-09-29
  • Publication No.: US20100014093A1
    Publication Date: 2010-01-21
  • Inventor: Feiling Wang
  • Applicant: Feiling Wang
  • Main IPC: G01B9/02
  • IPC: G01B9/02
Measurements of Optical Inhomogeneity and Other Properties in Substances Using Propagation Modes of Light
Abstract:
This application describes designs, implementations, and techniques for controlling propagation mode or modes of light in a common optical path, which may include one or more waveguides, to sense a sample.
Abstract(Chinese):

该应用描述了用于控制公共光路中的传播模式或光模式的设计，实现和技术，其可以包括一个或多个波导以感测样本。

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