发明申请
- 专利标题: POTENTIAL MEASUREMENT APPARATUS AND IMAGE FORMING APPARATUS
- 专利标题(中): 潜在测量装置和图像形成装置
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申请号: US12521081申请日: 2008-01-28
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公开(公告)号: US20100019779A1公开(公告)日: 2010-01-28
- 发明人: Kazuhiko Kato , Toshiyuki Ogawa , Yoshitaka Zaitsu , Takashi Ushijima , Kaoru Noguchi , Atsushi Kandori , Futoshi Hirose
- 申请人: Kazuhiko Kato , Toshiyuki Ogawa , Yoshitaka Zaitsu , Takashi Ushijima , Kaoru Noguchi , Atsushi Kandori , Futoshi Hirose
- 申请人地址: JP Tokyo
- 专利权人: CANON KABUSHIKI KAISHA
- 当前专利权人: CANON KABUSHIKI KAISHA
- 当前专利权人地址: JP Tokyo
- 优先权: JP2007-018599 20070129
- 国际申请: PCT/JP2008/051693 WO 20080128
- 主分类号: G01R27/26
- IPC分类号: G01R27/26 ; G01R1/02
摘要:
A potential measurement apparatus for measuring a surface potential of an object of measurement detects a change in electric charge induced at a detection electrode due to electrostatic induction by changing a distance between the detection electrode and the object of measurement in accordance with a predetermined period, using a neutral distance as reference, as a signal representing a change in electric current. The potential measurement apparatus includes a first detection unit for detecting a signal representing a fundamental period of the change in electric current and a signal representing a second harmonic period, a second detection unit for detecting information representing a capacitance between the detection electrode at the neutral distance and the object of measurement and an arithmetic unit for computationally obtaining information on the surface potential of the object of measurement, with eliminating an influence of the neutral distance and the capacitance, according to an outcome of detection of the first detection unit and an outcome of detection of the second detection unit.
公开/授权文献
- US07990159B2 Potential measurement apparatus and image forming apparatus 公开/授权日:2011-08-02
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