发明申请
- 专利标题： CHARACTERIZING A COMPUTER SYSTEM USING RADIATING ELECTROMAGNETIC SIGNALS MONITORED THROUGH AN INTERFACE
- 专利标题（中）： 表征使用通过接口监测的电磁信号的计算机系统
-
申请号： US12177724申请日： 2008-07-22
-
公开(公告)号： US20100023282A1公开(公告)日： 2010-01-28
- 发明人: Andrew J. Lewis , Kenny C. Gross , Aleksey M. Urmanov , Ramakrishna C. Dhanekula
- 申请人： Andrew J. Lewis , Kenny C. Gross , Aleksey M. Urmanov , Ramakrishna C. Dhanekula
- 申请人地址： US CA Santa Clara
- 专利权人： SUN MICROSYSTEM, INC.
- 当前专利权人： SUN MICROSYSTEM, INC.
- 当前专利权人地址： US CA Santa Clara
- 主分类号： G01R35/00
- IPC分类号： G01R35/00
摘要：
Some embodiments of the present invention provide a system that characterizes a computer system parameter by analyzing a target electromagnetic signal radiating from the computer system. First, the target electromagnetic signal is monitored using a conductor in an interface of the computer system. Then, the target electromagnetic signal is analyzed to characterize the computer system parameter.
信息查询
