发明申请
- 专利标题: PLASMA PROCESSING METHOD AND APPARATUS
- 专利标题(中): 等离子体处理方法和装置
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申请号: US12533700申请日: 2009-07-31
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公开(公告)号: US20100025372A1公开(公告)日: 2010-02-04
- 发明人: Hiroshi Tsujimoto , Toshifumi Nagaiwa , Yuji Otsuka
- 申请人: Hiroshi Tsujimoto , Toshifumi Nagaiwa , Yuji Otsuka
- 申请人地址: JP Tokyo
- 专利权人: TOKYO ELECTON LIMITED
- 当前专利权人: TOKYO ELECTON LIMITED
- 当前专利权人地址: JP Tokyo
- 优先权: JP2008-199429 20080801
- 主分类号: B44C1/22
- IPC分类号: B44C1/22 ; C23F1/08
摘要:
In a plasma processing method, a conductor of an electrostatic chuck (ESC) and an electrode are electrically grounded prior to starting the plasma processing. A DC voltage with a polarity is applied to the conductor at a first time point after loading a substrate on the electrode. Then, the electrode is switched from an electrically grounded state to an electrically floating state at a second time point. A RF power is then applied to the electrode at a third time point. The application of the RF power is stopped at a fourth time point after a specified time has lapsed from the third time point. Then, the electrode is switched from the electrically floating state to the electrically grounded state at a fifth time point. Thereafter, the application of the DC voltage is stopped and the conductor is restored to a ground potential at a sixth time point.
公开/授权文献
- US08277673B2 Plasma processing method and apparatus 公开/授权日:2012-10-02
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