发明申请
- 专利标题: Oblique incidence interferometer
- 专利标题(中): 倾斜入射干涉仪
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申请号: US12458461申请日: 2009-07-13
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公开(公告)号: US20100027028A1公开(公告)日: 2010-02-04
- 发明人: Yutaka Kuriyama , Kazuhiko Kawasaki
- 申请人: Yutaka Kuriyama , Kazuhiko Kawasaki
- 申请人地址: JP Kawasaki
- 专利权人: MITUTOYO CORPORATION
- 当前专利权人: MITUTOYO CORPORATION
- 当前专利权人地址: JP Kawasaki
- 优先权: JP2008-194382 20080729
- 主分类号: G01B9/02
- IPC分类号: G01B9/02
摘要:
An oblique incidence interferometer has favorable measurement accuracy while achieving miniaturization. The oblique incidence interferometer includes a light source that emits coherent light; a beam dividing unit that divides the coherent light from the light source into a measurement beam and a reference beam, polarizing directions of both beams being perpendicular to each other; a first beam folding unit that folds the measurement beam divided by the beam dividing unit to cause the folded measurement beam to be incident on the measurement object surface at a predetermined angle relative to the measurement object surface; a second beam folding unit that folds the measurement beam reflected by the measurement object surface; and a beam combining unit that combines the measurement beam folded by the second beam folding unit with the reference beam.
公开/授权文献
- US3143182A Sound reproducers 公开/授权日:1964-08-04
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