发明申请
- 专利标题: Scatter Attenuation Tomography
- 专利标题(中): 散射衰减层析成像
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申请号: US12551972申请日: 2009-09-01
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公开(公告)号: US20100034347A1公开(公告)日: 2010-02-11
- 发明人: Peter J. Rothschild
- 申请人: Peter J. Rothschild
- 申请人地址: US MA Billerica
- 专利权人: AMERICAN SCIENCE AND ENGINEERING, INC.
- 当前专利权人: AMERICAN SCIENCE AND ENGINEERING, INC.
- 当前专利权人地址: US MA Billerica
- 主分类号: G01N23/00
- IPC分类号: G01N23/00
摘要:
A system and methods for characterizing an inspected object on the basis of attenuation determined from pair-wise illuminated voxels. A beam of penetrating radiation characterized by a propagation direction and an energy distribution is scanned relative to an object, while scatter detectors with collimated fields-of-view detect radiation scattered by each voxel of the inspected object that is intercepted by the incident beam of penetrating radiation. By calculating the attenuation of penetrating radiation between pairs of voxels illuminated sequentially by the incident beam, a tomographic image is obtained characterizing the three-dimensional distribution of attenuation in the object of one or more energies of penetrating radiation, and thus of various material characteristics.
公开/授权文献
- US07924979B2 Scatter attenuation tomography 公开/授权日:2011-04-12
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