发明申请
- 专利标题： Methods for metal assays using optical techniques
- 专利标题（中）： 使用光学技术的金属测定方法
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申请号： US12533534申请日： 2009-07-31
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公开(公告)号： US20100035351A1公开(公告)日： 2010-02-11
- 发明人: Anoop Agrawal , John P. Cronin , Lori L. Adams , Akshay Agrawal , Juan Carlos L. Tonazzi
- 申请人： Anoop Agrawal , John P. Cronin , Lori L. Adams , Akshay Agrawal , Juan Carlos L. Tonazzi
- 主分类号： G01N33/20
- IPC分类号： G01N33/20
摘要：
An improved optical method for determining metal or a metal compound thereof in a sample with organic impurities. The optical method comprises of solvating the metal in a liquid medium and then mixing this liquid medium with an optical indicator and then measuring the presence of the metal. The improvement lies in removing any organic impurities by the addition of an additive, where the said additive is removed before the optical indicator is added.
公开/授权文献
- US08003394B2 Methods for metal assays using optical techniques 公开/授权日：2011-08-23
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